UCSB TOB Module Test Result Page

Failure Type	Noise (ADC)	Gain (ADC/MIP)	Gain Chi-squared/DOF	Difference from Pedestal Average (ADC)
Hybrid-PA open	0.5 < N < 0.9	G > 27
PA-Sensor open	?????	?????
Sensor-Sensor open	1.0 < N < 1.4	16
Shorted Strips		8 < G < 13
Noisy Strips	N > 3
Bad Pedestal				P > 60 or P < 30
Bad Gain		G < 15 or G > 30 or	Chi-squared> 50
Dead	N < 0.4;	G < 3
Bad Cell	N > 3 or N < 0.7 or			P > 60 or P< 30

Prototype module (with ceremanic hybrid)

Module	Bias Voltage	Depletion Voltage		Faults found in testing										Total Faults Found	Comments
		Near Sensor	Far Sensor	Opens			Shorted Strips	Pinholes(Saturated)	Noisy Strips	Bad Pedestal	Bad Gain	Dead Strips	Bad pipeline cell
				Hybrid-PA	PA-Sensor	Sensor-Sensor
83	150 V	175 V	142 V			1--6	(340,341)	10,26,92,125,242,346,347,348						16 (3.1%)
83	0 V	175 V	142 V			1--6	(340,341)	7,10,12,23,25,26,32,34,40,42,51,55,64,77,85,92,98 102,106,110,113,115,118,119,121,123--125,130,144 151,155--157,163,165,169,170,173,195,225,239,242 254,256,259,304,319,335,346--348,358,369,385,396 403,404,413,423,433--436,443,446,453--457,464,466 468,472,475,476,479--481,483--487,490,492--512						113 (22.1%)	After HV supply failure

Click hybrid number for indepth test results (figures, root files, etc.)

Testing Setup optizimed to minimize difference between the raw and common-mode subtracted noise with the invertor off in peak mode. When the two match, the common mode subtraction feature on the chip is doing nothing, yielding predictable results for noise measurements.

Module damaged by HV power supply failure on switch on (0V HV). HV supply failure caused > 700 V to be placed on HV (nearly) instantaneously.

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Pre-production modules (with flex hybrid and ceremanic substrate)

Module	Bias Voltage	Depletion Voltage		Faults found in testing										Total Faults Found	Comments
		Near Sensor	Far Sensor	Opens			Shorted Strips	Pinholes(Saturated)	Noisy Strips	Bad Pedestal	Bad Gain	Dead Strips	Bad pipeline cell
				Hybrid-PA	PA-Sensor	Sensor-Sensor

Click hybrid number for indepth test results (figures, root files, etc.)

Testing Setup optizimed to minimize difference between the raw and common-mode subtracted noise with the invertor off in peak mode. When the two match, the common mode subtraction feature on the chip is doing nothing, yielding predictable results for noise measurements.

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Summary of hybrid test on ARC stand

Hybrid	Pitch Adaptor Bonded	DCU/PLL/MUX Faults			APV Faults									Total Faults Found	Comments
		DCU	PLL	MUX	Error Bit	Pipecell Synch Problems	Bad Header	Noisy	Bad Pedestal	Bad Gain	Bad pipeline	Saturated	Dead
103(Ceramic)	No														Gain ± 5% non-uniformity within chip 48
255	No
262	No
286	No
301	No														Gain non-linearity on chip 40 at 0 MIP injected
321	No

Click hybrid number (30216713XXXXX) for indepth test results (figures, root files, etc.)