Of the 16 modules tested at UCSB, 7 modules have channels with increasing noise with increasing voltage. In 6 of the cases, nothing bad was found in the sensor QC, but with a optical scope lithographic errors can be seen. In the seventh module, the channels are neighbor to a pinhole found in sensor probing. In addition 4 more modules have localized micro-discharge which causes extremely high noise on the channel, and high common mode for the chip. 6-14 channels around the channel with the micro-discharge has to be removed to reduce the common mode noise of the chip to an acceptable level. Here's a link to an excel file of the IV curves for the tested modules.
Pictures of defects in channels 278 and 279. NOT FOUND IN SENSOR PROBING
Picture of defect (scratch) in channel 333. NOT FOUND IN SENSOR PROBING
Picture of defect in channel 377. NOT FOUND IN SENSOR PROBING
Strip 91 a known pinhole in the first sensor.
Mid-sensor opens in channels 69-71 in the 1st sensor
Picture of defect in channel 166. NOT FOUND IN SENSOR PROBING
Pictire of scratch in channel 316
Picture of defect in channel 303. NOT FOUND IN SENSOR PROBING
Pictire of scratch in channel 344. NOT FOUND IN SENSOR PROBING